Sort-It LT Type/Resistivity Tester For Silicon Wafers, Ingots and Pot Scrap
21st Century New Design incorporates a computerized brain with a highly reliable four point probe head. Ergonomically designed probe handle. Different modes allow you to test resistance and type on Silicon Wafers and Pot Scrap with high thru-put. Digital display shows you the actual resistance of the probed sample from 0.1 to 200 ohm cm. Typing features include sound reporting for N and P with visual display. Computer takes 4 readings instantly when valid conditions occur and displays the results in ¼ second.
- Resistance reporting-0.1 to 200 ohm cm Reference material: Oxide free silicon wafers and pot scrap
- Type reporting N or P on materials greater than 0.01 ohm cm Reference material: Oxide free silicon wafers and pot scrap
- Rectification method for typing
- Bench Top (AC adapter) Operation
- Fast Sorting Tester
- Dual Current Sources: .200 mA & 2.00 mA selectable from front panel
- LCD display with sound reporting
- Mute switch
- 4 Point Probe Technology (single probe for res and type)
- Ergonomic Probe Handle with integrated switch allows operator to seamlessly switch between res and type modes
- 1 year Warranty
- Accuracy: Typical +/- 2% +1 Count @ 75 to 77 degrees F after 3 minute warm up, Maximum +/- 5% + 2 Counts @ 75 to 77 degrees F after 3 minute warm up
- International version available (Universal power supply)
- Kit includes: Tester, UL Approved Wall Transformer 120VAC 60 Hz USA Style Plug, Relative Resistance Standard, Manual on CD, Shipping/Carrying Case
*** Terms and conditions apply. Complete terms and conditions are listed in our formal quotation which is available upon request.
